Entrevista a Erik Olin Wright
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چکیده
منابع مشابه
An interview with Erik Olin
“I am a classic baby-boomer: born in Berkeley in 1947 while my father was in medical school on the post-WWII G.I. Bill. I was raised in Lawrence, Kansas, where both of my parents were professors at the University of Kansas. I knew that I wanted to be a professor from about age 11. I am also a product of the 1960s, radicalized politically first by the civil rights movement and then by the the st...
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Aage Sørensen, in “Toward a Sounder Basis for Class Analysis,” argues that Marxists are correct in placing exploitation at the center of class analysis since an exploitation-centered concept of class has a much greater potential for explaining the structural foundations of social conflicts over inequality than does its principle rival, the material “life conditions” conception of class. But he ...
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Resumen. OBJETIVO: Estudiar la efectividad relativa de las técnicas de entrevista abierta y entrevista independiente de contexto en la identificación de requisitos para sistemas software. MÉTODO: Experimento controlado ensayando dos factores: “tipo de entrevista” (abierta e independiente de contexto) y “tipo de problema” (identificación de requisitos para dos sistemas software distintos). Debid...
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s of the Tenth International Congress of Phonetic Sciences.Dordrecht: Foris Publications.253–58.Ohala, John J. (1985). Linguistics andautomatic processing of speech.In R. De Mori and C. Y. Suen (eds.), New Systems and Architectures for Automatic Speech Recognition and Synthesis. Berlin: Springer-Verlag.447–75.
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Microarray measurements are affected by a variety of systematic experimental errors limiting the accuracy of data produced. Two well-known systematic errors for two-colour arrays are the so-called intensity-dependent and spatial (location-dependent) dye bias. Normalisation aims to correct for systematic errors in microarray data. The common linear (or global) normalisation method often fails to...
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ژورنال
عنوان ژورنال: Revista de Sociología
سال: 2013
ISSN: 0716-632X,0716-632X
DOI: 10.5354/0716-632x.2012.27482